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| Research Topics |
Team |
Description |
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Using short-pulse lasers to study the single event effects
which can happen on the electronic devices and integrated
circuits in space environment |
NTU ESOE, NTU EE, TASA |
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DUV inspection of through silicon vias for 3D IC package |
NTU ESOE, NTU ME, NTUT ME |
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Intraocular lens |
NTU ESOE, NTUST ME, NTU ME, NTU School of Medicine,
NTUH Ophthalmology, NTU Chem. Eng., and NTU Biomed. Eng. |
 |
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Image recognition
with deep learning |
NTU ESOE, NTUT ME |
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EUV inspection for wafer mask |
NTU ESOE, NTU EE, TIRI |
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Developing detection devices and IOT system for detecting
ocean microplastics |
NTU ESOR, NTUT ME |
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